Key Technical Features & Specifications
- Integrated Design – Compact and portable
The completely self-contained design maximizes the choice of installation locations, and for the first time, enables a truly effortless relocation of the electron microscope.
- No Special Facilities – Worry-free installation
The LVEM 25E can be readily installed in most spaces without the need for special electrical or plumbing considerations. Simply plug it into a standard electrical outlet and put it into operation in just a few hours.
- Permanent Magnet Lenses – No cooling required
The unique LVEM platform employs permanent magnet lenses and makes the device compact, robust and easy to use while eliminating the need for any cooling.
- Fast and Easy Vacuum Recovery – Automated soft bake and gun conditioning
The LVEM 25E reduces downtime should there be a loss of vacuum. With the automatic soft bake and gun conditioning functions, recovering the vacuum is fast and does not require a service visit.
- Direct Beam Measurement – Low dose quantification
This LVEM 25E function enables the users to measure sample irradiation.
- Automated Alignments – Optimal imaging conditions
Automated software adjustment and control of the LVEM 25E column alignments and aperture positions eliminates the need for the operator to manually correct them. This means the LVEM 25E is always ready to image with optimal performance, and allows for rapid and effortless switching between modes.
- Two-stage magnification – Robust & Powerful
In a unique LVEM design, light optics provide further magnification of the electron beam image, providing the users with stable and reliable performance.
- Rapid sample exchange – High-throughput imaging
A redesigned vacuum system, employing an integrated and maintenance free turbomolecular pump, combined with vibration free ion getter pumps, allows for a super-fast sample exchange time and produces an ultra-high vacuum imaging environment, free from contamination.
- Field Emission Gun – Highest contrast
A 25kV Schottky type FEG with very high brightness and spatial coherency allows for strong interactions between the emitted electrons and the sample. This is what provides the LVEM 25E with uniquely high contrast.
Specifications
| Feature | Specification |
|---|---|
| Electron Source | Schottky FEG (25kV) |
| Imaging Modes | TEM, STEM, SEM, ED, EDS |
| Resolution (TEM) | 1.0 nm |
| Resolution (STEM) | 1.2 nm |
| Magnification | 2,000x – 1,000,000x |
| Sample Holder | Single grid holder |
| Sample Exchange | < 3 minutes |
| Vacuum System | Oil-free (TMP / 2x IGP) |
| Detector | YAG scintillator + sCMOS (2k x 2k) |
| Dimensions (W x D x H) | 50 x 70 x 120 cm (19.7 x 27.6 x 47.2 in) |
| Weight | 180 kg (397 lbs) |
| Power Supply | 100-240V, 50/60 Hz, 500W |
| Facility Requirements | None (no cooling water, no compressed air, no antivibration) |



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